Ftir analysis providers in Chelmsford, MA 2021? The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.
SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects.
How do I submit a sample or a set of samples? To submit a sample or set of samples, please see the page How to Submit Samples. What if I believe my samples are hazardous? We are not equipped to handle or dispose of every kind of hazardous material. Please call us before sending in any potentially hazardous samples. In cases where we are able to analyze your harzardous samples we may not be able to dispose of them and therefore we will return them to you. Read additional info at www.microvisionlabs.com. ?We partner with companies in all phases of product development and sales, including R&D, manufacturing, QC, advertising and failure analysis. Our laboratory offers a highly-trained and experienced staff utilizing a powerful set of analytical tools (SEM with EDS and backscatter detectors, Bruker X-Flash elemental mapping, X-Ray imaging, Micro-FTIR spectroscopy, Micro-XRF, light microscopy, cross sectioning/precision polishing and microhardness testing).
The data indicated that a significant portion of the dust was from the insulation in the attic. The contractor had replaced a portion of duct work running to the master bedroom. During this replacement, fiberglass insulation was knocked into the ducting. The small glass insulation fibers were spread through the AC ducts and settling out of the air throughout the house. The client was relieved to know what was causing their skin irritation and the significant dust build up. Using the results garnered from the analysis from MicroVision Labs they were able to have the contractor clean out the duct work and act to prevent further spread of the insulation fibers and properly clean up the settled dust in the house that was the cause of the homeowner’s skin irritation.
Close examination of any possible defects or voids was undertaken at higher magnification. The voids did not appear to create any structural or conductivity issues. Additionally, the formation and contiguity of intermetallic bonds between the contacts and solder were shown using a combination of EDS line scan elemental spectroscopy and elemental mapping. The SEM image and the EDS map to the left show the intermetallic layer between the copper wire and the tin/lead solder via the mixture of the red copper and the blue tin. Discover additional info on https://microvisionlabs.com/.