Xrf analysis services in Chelmsford? SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects. Find more info on this website.
The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.
Scanning electron microscopy with energy dispersive xray spectroscopy (SEM-EDS) was used to identify the particles. The SEM showed an elevated concentration of iron and iron oxide in the impacted areas. The backscatter electron (BSE) image which correlates brightness in the image with atomic density, highlighted the iron particles that were embedded in the tile and the EDS spectrum confirms the PLM Image chemical composition of these higher density particles.
How do I submit a sample or a set of samples? To submit a sample or set of samples, please see the page How to Submit Samples. What if I believe my samples are hazardous? We are not equipped to handle or dispose of every kind of hazardous material. Please call us before sending in any potentially hazardous samples. In cases where we are able to analyze your harzardous samples we may not be able to dispose of them and therefore we will return them to you.
Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation.
MicroVision Laboratories, Inc. has been providing businesses, consultants and other testing laboratories with expert microscopy and analytical services since 2003. Our client base covers a broad spectrum of industries including semi-conductors, aerospace, electronics, biomedical, ceramics, optics, pharmaceuticals, mineralogy, metallurgy, thin films, environmental, membranes filtration and industrial hygiene. Find a few more details on https://microvisionlabs.com/.